J. Oualid

Two‐dimensional modelling and characterization of gate‐to‐drain overlap contribution on the leakage current of a MOSFET, used as a GCD

R. Jérisian, E. Ciantar, S. Burgniard, 1993 .

Correlation between space charge created by Fowler-Nordheim electron injections and charge to breakdown (QBD) of gate oxides in MOS capacitors: modeling and experiment

B. Sagnes, J. Oualid, Philippe Boivin, 1995, Advanced Lithography.

Effects of high field electron injection into the gate oxide of P-channel metal-oxide-semiconductor transistors

E. Ciantar, J. Oualid, R. Jerisian, 1993 .

Experiments and modeling to determine trapped holes and slow states in Fowler-Nordheim stressed MOS capacitors

Dominique Vuillaume, B. Sagnes, K. Yckache, 1995 .

Hot-carrier effects on leakage currents in MOSFETs—Modelling and experiment

R. Jérisian, E. Ciantar, S. Burgniard, 1993 .