C. Schlunder
发表
T. Grasser,
H. Reisinger,
K. Hofmann,
2010,
2010 IEEE International Integrated Reliability Workshop Final Report.
H. Reisinger,
W. Gustin,
C. Schlunder,
2007,
2007 IEEE International Integrated Reliability Workshop Final Report.
C. Pacha,
H. Reisinger,
K. Hofmann,
2010,
2010 Symposium on VLSI Technology.
H. Reisinger,
W. Gustin,
C. Schlunder,
2007,
IEEE Transactions on Device and Materials Reliability.
C. Schlunder,
A. Martin,
2012,
2012 IEEE International Integrated Reliability Workshop Final Report.
H. Reisinger,
W. Kanert,
K. Hofmann,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
H. Reisinger,
W. Gustin,
C. Schlunder,
2008,
2008 IEEE International Reliability Physics Symposium.
H. Reisinger,
W. Gustin,
C. Schlunder,
2011,
2011 International Reliability Physics Symposium.
T. Grasser,
P.-J. Wagner,
H. Reisinger,
2009,
IEEE Transactions on Device and Materials Reliability.
T. Grasser,
H. Reisinger,
W. Gustin,
2008,
2008 IEEE International Integrated Reliability Workshop Final Report.
Applying the universal recovery equation for fast wafer level reliability monitoring NBTI assessment
H. Reisinger,
C. Schlunder,
R.-P. Vollertsen,
2009,
2009 IEEE International Reliability Physics Symposium.
C. Schlunder,
A. Martin,
P.-E. Oswald,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
H. Reisinger,
W. Gustin,
C. Schlunder,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
H. Reisinger,
W. Gustin,
C. Schlunder,
2007,
IEEE Transactions on Device and Materials Reliability.
C. Schlunder,
B. Ankele,
R. Thewes,
2001,
31st European Solid-State Device Research Conference.
H. Reisinger,
W. Gustin,
C. Schlunder,
2007,
ESSDERC 2007 - 37th European Solid State Device Research Conference.
C. Schlunder,
B. Ankele,
R. Thewes,
1999,
International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318).
T. Grasser,
H. Reisinger,
W. Gustin,
2008,
2008 IEEE International Integrated Reliability Workshop Final Report.