Pierre-Didier Mauroux

Analysis and Fault Modeling of Actual Resistive Defects in ATMEL eFlash Memories

Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, 2012, J. Electron. Test..

On using a SPICE-like TSTAC™ eFlash model for design and test

Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, 2011, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems.

NAND flash testing: A preliminary study on actual defects

Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, 2009, 2009 International Test Conference.

A two-layer SPICE model of the ATMEL TSTAC™ eFlash memory technology for defect injection and faulty behavior prediction

Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, 2010, 2010 15th IEEE European Test Symposium.