V. Govind

发表

R. Ubar, J. Raik, V. Govind, 2006, 2006 15th Asian Test Symposium.

J. Raik, V. Govind, 2012, 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS).

R. Ubar, J. Raik, V. Govind, 2006, 2006 International Biennial Baltic Electronics Conference.