Giuseppe Croce

ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology

Gaudenzio Meneghesso, Enrico Zanoni, Simona Podda, 2002, Microelectron. Reliab..

Overstress and electrostatic discharge in CMOS and BCD integrated circuits

Gaudenzio Meneghesso, Giuseppe Croce, Mauro Ciappa, 2000 .

LDMOS implementation in a 0.35 /spl mu/m BCD technology (BCD6)

Alessandro Moscatelli, Giuseppe Croce, Claudio Contiero, 2000, 12th International Symposium on Power Semiconductor Devices & ICs. Proceedings (Cat. No.00CH37094).

Simulation of off-state degradation at high temperature in High Voltage NMOS transistor with STI architecture

Giuseppe Croce, Lucia Zullino, Giansalvo Pizzo, 2010, 2010 22nd International Symposium on Power Semiconductor Devices & IC's (ISPSD).

TCAD investigation on hot-electron injection in new-generation technologies

Enrico Sangiorgi, Claudio Fiegna, Antonio Gnudi, 2018, Microelectron. Reliab..

0.16 μm BCD single-photon avalanche diode with 30 ps timing jitter, high detection efficiency and low noise

Federica Villa, Alberto Tosi, F. Zappa, 2018, Commercial + Scientific Sensing and Imaging.

Investigation of the hot carrier degradation in power LDMOS transistors with customized thick oxide

Enrico Sangiorgi, Paolo Magnone, Claudio Fiegna, 2017, Microelectron. Reliab..

ESD in Smart Power Processes

Gaudenzio Meneghesso, Antonio Andreini, Luca Sponton, 2003 .

La regolazione dei servizi pubblici in condizione di infornazione asimmetrica. Una introduzione

Giuseppe Croce, G. Croce, 1998 .

Optimization of ESD protection structures suitable for BCD6 smart power technology

Gaudenzio Meneghesso, Enrico Zanoni, Luca Sponton, 2003, Microelectron. Reliab..

ESD protection structures for BCD5 smart power technologies

Gaudenzio Meneghesso, Enrico Zanoni, Luca Sponton, 2001, Microelectron. Reliab..

Buried CMOS Structure with a Straddle-Gate Architecture for Low Noise-Analog Applications

Paolo Fantini, Giuseppe Croce, Damiano Riccardi, 2003 .