Steven A. Scheer

SHUTTLE/MIR PLUME IMPINGEMENT LOADS: FLIGHT VERIFICATION AND POST-FLIGHT ANALYSIS

Steven A. Scheer, 1997 .

Finding the right way: DFM versus area efficiency for 65 nm gate layer lithography

Carlos Fonseca, Alan C. Thomas, Uwe Schroeder, 2006, SPIE Advanced Lithography.

Novel polychromatic measurement technique for determining the dissolution rate of very thin resist films

Doris Kang, Stewart A. Robertson, Colin J. Brodsky, 2002, SPIE Advanced Lithography.

International Space Station Microgravity Analytical Model Correlation And Update

Steve DelBasso, Steven A. Scheer, Michael Laible, 2003 .

The design of a cost effective multi wavelength development rate monitoring tool

Doris Kang, Stewart A. Robertson, Colin J. Brodsky, 2002 .

Design of a cost-effective multiwavelength development rate monitoring tool

Doris Kang, Stewart A. Robertson, Colin J. Brodsky, 2002, SPIE Advanced Lithography.

Secondary debris impact damage and environment study

Steven A. Scheer, S. Scheer, Gillian L.Y. Shephard, 1993 .

Crew activity and motion effects on the space station

Steven A. Scheer, Brian V. Rochon, 1987 .