Stylianos Siskos

A complete scheme of built-in self-tests (BIST) structure for fault diagnosis in analog circuits and systems

J. M. Kontoleon, Alkis A. Hatzopoulos, Stylianos Siskos, 1993 .

CMOS outlier rejection circuit

Spyridon Vlassis, Stylianos Siskos, 2001 .

Analysis and selection criteria of BSIM4 flicker noise simulation models

Gérard Sarrabayrouse, T. Noulis, Stylianos Siskos, 2008 .