Max B. Koentopp

Wafer-thickness Dependence of Double-side Contacted Rear Junction n-type Solar Cells☆

M. Kauert, Jörg W. Müller, Janko Cieslak, 2014 .

Towards a PID test standard: Understanding and modeling of laboratory tests and field progression

Max B. Koentopp, Marcel Krober, Christian Taubitz, 2015, 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC).

Manufacturing 100‐µm‐thick silicon solar cells with efficiencies greater than 20% in a pilot production line

Christophe Ballif, Giso Hahn, Francesca Ferrazza, 2015 .