A. Bhattacharyya

MECHANICS OF CHIP-BREAKERS

T. L. Subramanian, A. Bhattacharyya, 1965 .

Breakdown voltage characteristics of thin oxides and their correlation to defects in the oxide as observed by the EBIC technique

A. Bhattacharyya, J.D. Reimer, K.N. Ritz, 1986, IEEE Electron Device Letters.

Sidewall oxidation of polycrystalline-silicon gate

Y. Taur, A. Bhattacharyya, C.Y. Wong, 1989, IEEE Electron Device Letters.

Mechanism of degradation of LDD MOSFETs due to hot-electron stress

A. Bhattacharyya, A. Bhattacharyya, S. Shabde, 1988 .