Tsung-Yeh Li

AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects

Shi-Yu Huang, Hsi-Pin Ma, Cheng-Wen Wu, 2010, 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems.

AC-Plus Scan Methodology for Small Delay Testing and Characterization

Shi-Yu Huang, Hsi-Pin Ma, Cheng-Wen Wu, 2013, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.