Som Nath

Fast electromigration wafer mapping for wafer fab process monitoring and improvement

Yuan Li, Leo van Marwijk, Som Nath, 2008, Microelectron. Reliab..

Dictionary of Statistics

Som Nath, 2007 .

Experimental Study of Temperature Dependence of Program/Erase Endurance of Embedded Flash Memories with 2T-FNFN Device Architecture

Guoqiao Tao, H. Chauveau, Som Nath, 2006, 2006 IEEE International Integrated Reliability Workshop Final Report.

Experimental study of carrier transport in multi-layered structures

Guoqiao Tao, Cedric Ouvrard, Som Nath, 2007, Microelectron. Reliab..

Reliability tests for modelling of relative humidity sensor drifts

Hilco Suy, Som Nath, E. Lous, 2017, 2017 IEEE International Reliability Physics Symposium (IRPS).

Experimental Study of Charge Displacement in Nitride Layer and its Effect on Threshold Voltage Instability of Advanced Flash Memory Devices

Guoqiao Tao, H. Chauveau, R. Verhaar, 2007, 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits.