P. P. Majewski

Observations of single event failure in power MOSFETs

R. Koga, J. L. Wert, D. K. Nichols, 1994, Workshop Record. 1994 IEEE Radiation Effects Data Workshop.

Single event upset and latchup measurements in avionics devices using the WNR neutron beam and a new neutron-induced latchup model

Stephen A. Wender, J. L. Wert, A. Gavron, 1995, Proceedings of 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95).

Update of single event failure in power MOSFETs

T. F. Miyahira, J. L. Wert, D. K. Nichols, 1996, 1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference.

First observations of power MOSFET burnout with high energy neutrons

E. Normand, D. L. Oberg, Jerry L. Wert, 1996 .

Comparison and implications of charge collection measurements in silicon and InGaAs irradiated by energetic protons and neutrons

E. Normand, Stephen A. Wender, J. L. Wert, 1995 .