T. L. Turflinger

Total dose testing of 10-bit low voltage differential signal (LVDS) serializer and deserializer

B. J. Hamilton, T. L. Turflinger, 2001, 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588).

Single-event effects in analog and mixed-signal integrated circuits

T. L. Turflinger, T. Turflinger, 1996 .

Single-event effects in resolver-to-digital converters

T. L. Turflinger, A. B. Campbell, Dale McMorrow, 1999 .