T. Miki

I-Q signal generation techniques for communication IC testing and ATE systems

H. Kobayashi, M. Murakami, S. N. B. Mohyar, 2016, 2016 IEEE International Test Conference (ITC).

A 0.9-V 1T1C SBT-based embedded nonvolatile FeRAM with a reference voltage scheme and multilayer shielded bit-line structure

S. Iwanari, H. Hirano, T. Nakakuma, 2005, IEEE Journal of Solid-State Circuits.