Horacio Mendez

Shielding Theory of Enclosures with Apertures

Horacio Mendez, 1978, IEEE Transactions on Electromagnetic Compatibility.

Lifetest IC failures due to metal extrusion and migration resulting from process-induced stress relief

Paul Tuohy, Mark Franklin, Michael Phillips, 1993, Other Conferences.

Imaging gate oxide ruptures

Nicholas Dickson, Steve Morris, Ronald E. Pyle, 1993, Other Conferences.

A high-performance half-micrometer generation CMOS technology for fast SRAMs

Bich-Yen Nguyen, Robert E. Jones, James D. Hayden, 1991 .

A high-performance sub-half micron CMOS technology for fast SRAMs

Bich-Yen Nguyen, James D. Hayden, James R. Pfiester, 1989, International Technical Digest on Electron Devices Meeting.