Kwang Hoon Han

Automatic End Point Detection of Plasma Etching Process Using the Multi-Way PCA of the Whole Optical Emission Spectrum

Jae Won Lee, En Sup Yoon, Sang Kyun Park, 2006, 2006 SICE-ICASE International Joint Conference.

Toward effective design and adoption of catalyst-based filter for indoor hazards: Formaldehyde abatement under realistic conditions.

Bing Guo, Kwang Hoon Han, Jensen S Zhang, 2017, Journal of hazardous materials.

Real-Time End-Point Detection Using Modified Principal Component Analysis for Small Open Area SiO2 Plasma Etching

En Sup Yoon, Heeyeop Chae, Kyounghoon P. Han, 2008 .