P. Girard

发表

Multiple-Cell-Upsets on a commercial 90nm SRAM in dynamic mode

G. Tsiligiannis, L. Dilillo, A. Bosio, 2013, 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

Power supply noise and ground bounce aware pattern generation for delay testing

L. Dilillo, A. Bosio, P. Girard, 2011, 2011 IEEE 9th International New Circuits and systems conference.

Neuton-induced Multiple Bit Upsets on dynamically-stressed commercial SRAM arrays

L. Dilillo, P. Girard, F. Wrobel, 2011, 2011 12th European Conference on Radiation and Its Effects on Components and Systems.

A signature-based approach for diagnosis of dynamic faults in SRAMs

L. Dilillo, A. Bosio, P. Girard, 2008, 2008 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era.

Evaluations of leakage currents and capacitances on elementary CMOS devices

P. Girard, Pascal Nouet, A. Khalkhal, 1993, ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures.

Fast Bridging Fault Diagnosis using Logic Information

A. Bosio, P. Girard, A. Virazel, 2007, 16th Asian Test Symposium (ATS 2007).

Fast and accurate electro-thermal analysis of three-dimensional power delivery networks

L. Dilillo, A. Bosio, P. Girard, 2013, 2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).

An efficient hybrid power modeling approach for accurate gate-level power estimation

A. Bosio, P. Girard, A. Virazel, 2015, 2015 27th International Conference on Microelectronics (ICM).

Minimizing Peak Power Consumption during Scan Testing: Structural Technique for Don't Care Bits Assignment

P. Girard, S. Pravossoudovitch, A. Virazel, 2006, 2006 Ph.D. Research in Microelectronics and Electronics.

A fault-simulation-based approach for logic diagnosis

L. Dilillo, A. Bosio, P. Girard, 2009, 2009 4th International Conference on Design & Technology of Integrated Systems in Nanoscal Era.

New test structures for on-chip absolute and accurate measurement of capacitances in a CMOS process

P. Girard, Pascal Nouet, A. Khalkhal, 1994, Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures.

Neutron detection in atmospheric environment through static and dynamic SRAM-based test bench

L. Dilillo, P. Girard, F. Wrobel, 2011, 2011 12th Latin American Test Workshop (LATW).

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

G. Tsiligiannis, L. Dilillo, A. Bosio, 2014, IEEE Transactions on Nuclear Science.

Multiple Cell Upset Classification in Commercial SRAMs

G. Tsiligiannis, L. Dilillo, A. Bosio, 2014, IEEE Transactions on Nuclear Science.

Influence of Threshold Voltage Deviations on 90nm SRAM Core-Cell Behavior

P. Girard, A. Virazel, C. Landrault, 2007, 16th Asian Test Symposium (ATS 2007).

Dynamic Test Methods for COTS SRAMs

G. Tsiligiannis, L. Dilillo, A. Bosio, 2014, IEEE Transactions on Nuclear Science.

Delay fault testing: choosing between random SIC and random MIC test sequences

P. Girard, S. Pravossoudovitch, C. Landrault, 2000, Proceedings IEEE European Test Workshop.

Session details: Hot topic - test challenges for low power devices

P. Girard, A. Raghunathan, 2008, DATE '08.

Minimizing peak power consumption during scan testing: test pattern modification with X filling heuristics

P. Girard, A. Virazel, C. Landrault, 2006, International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006..

Power-Aware Test Data Compression for Embedded IP Cores

P. Girard, A. Virazel, C. Landrault, 2006, 2006 15th Asian Test Symposium.

Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress

L. Dilillo, P. Girard, F. Wrobel, 2012, IEEE Transactions on Nuclear Science.

Using TMR Architectures for SoC Yield Improvement

P. Girard, S. Pravossoudovitch, A. Virazel, 2009, 2009 First International Conference on Advances in System Testing and Validation Lifecycle.

Test cells for evaluation of low currents and capacitances CMOS devices

P. Girard, Pascal Nouet, A. Khalkhal, 1993 .

Embedded flash testing: overview and perspectives

P. Girard, A. Virazel, C. Landrault, 2006, International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006..

A test solution for oxide thickness variations in the ATMEL TSTAC™ eFlash technology

L. Dilillo, A. Bosio, P. Girard, 2011, 2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS).

Power reduction through X-filling of transition fault test vectors for LOS testing

L. Dilillo, A. Bosio, P. Girard, 2011, 2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS).

Testing a Commercial MRAM Under Neutron and Alpha Radiation in Dynamic Mode

G. Tsiligiannis, L. Dilillo, A. Bosio, 2013, IEEE Transactions on Nuclear Science.

Simple evaluation of very low currents in process characterization

P. Girard, P. Nouet, F. M. Roche, 1990, Proceedings of the 1991 International Conference on Microelectronic Test Structures.

Requirements for delay testing of look-up tables in SRAM-based FPGAs

P. Girard, S. Pravossoudovitch, M. Renovell, 2003, The Eighth IEEE European Test Workshop, 2003. Proceedings..

Cell-Aware Diagnosis of Customer Returns Using Bayesian Inference

Arnaud Virazel, Alberto Bosio, P. Girard, 2021, 2021 22nd International Symposium on Quality Electronic Design (ISQED).

A Fast and Low Cost Embedded Test Solution for CMOS Image Sensors

Arnaud Virazel, P. Girard, Philippe Debaud, 2021, 2021 IEEE International Test Conference (ITC).

Preliminary Defect Analysis of 8T SRAM Cells for In-Memory Computing Architectures

Arnaud Virazel, P. Girard, Marie-Lise Flottes, 2021, 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS).

Modeling and simulations of the behavior of glass particles in a rotating drum in heptane and water vapor atmospheres

P. Girard, P. Girard, N. Fraysse, 2002 .