Thomas Santini

Accelerated degradation data of SiC MOSFETs for lifetime and Remaining Useful Life assessment

Thomas Santini, Sébastien Morand, Mitra Fouladirad, 2014, Microelectron. Reliab..

Non-homogenous gamma process: Application to SiC MOSFET threshold voltage instability

Thomas Santini, Sébastien Morand, Mitra Fouladirad, 2017, Microelectron. Reliab..

Gate oxide reliability assessment of a SiC MOSFET for high temperature aeronautic applications

Thomas Santini, Bruno Allard, Morand Sebastien, 2013, 2013 IEEE ECCE Asia Downunder.

Experimental Assessment of Cache Memory Soft Error Rate Prediction Technique

Thomas Santini, Florent Miller, Regis Leveugle, 2012, IEEE Transactions on Nuclear Science.