Florent Miller

发表

Accelerated degradation data of SiC MOSFETs for lifetime and Remaining Useful Life assessment

Thomas Santini, Sébastien Morand, Mitra Fouladirad, 2014, Microelectron. Reliab..

A Monte-Carlo engineer tool for the prediction of SEU proton cross section from heavy ion data

Florent Miller, Thierry Carriere, Nadine Buard, 2011, 2011 12th European Conference on Radiation and Its Effects on Components and Systems.

Simulation of Proton Induced SET in Linear Devices and Assessment of Sensitive Thicknesses

Florent Miller, Thierry Carriere, Sebastien Morand, 2015, 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

Non-homogenous gamma process: Application to SiC MOSFET threshold voltage instability

Thomas Santini, Sébastien Morand, Mitra Fouladirad, 2017, Microelectron. Reliab..

Component with an integrated circuit comprising a crypto-processor and method of installation

Florent Miller, Nadine Buard, Imad Lahoud, 2006 .

Effets destructifs induits par les particules de l'environnement naturel dans les composants de puissance

Florent Miller, Nadine Buard, Aurore Luu, 2010 .

Prediction of transient induced by neutron/proton in CMOS combinational logic cells

Lorena Anghel, Florent Miller, Guillaume Hubert, 2006, 12th IEEE International On-Line Testing Symposium (IOLTS'06).

Methodologies and Tools for the Evaluation of the Sensitivity to Radiation of SRAM-based FPGAs

Florent Miller, J. Ferron, Raoul Velazco, 2008 .

Prediction of proton cross sections for SEU in SRAMs and SDRAMs using the METIS engineer tool

Florent Miller, Cécile Weulersse, Thierry Carrière, 2015, Microelectron. Reliab..

Novel DRAM mitigation technique

Florent Miller, Nadine Buard, Antonin Bougerol, 2009, 2009 15th IEEE International On-Line Testing Symposium.

SDRAM Architecture & Single Event Effects Revealed with Laser

Florent Miller, Nadine Buard, Antonin Bougerol, 2008, 2008 14th IEEE International On-Line Testing Symposium.

Latchup effect in CMOS IC: a solution for crypto-processors protection against fault injection attacks?

Florent Miller, Nadine Buard, Rémi Gaillard, 2007, 13th IEEE International On-Line Testing Symposium (IOLTS 2007).

Predictions of Proton Cross-Section and Sensitive Thickness for Analog Single-Event Transients

Florent Miller, Thierry Carriere, Sebastien Morand, 2016, IEEE Transactions on Nuclear Science.

Test methodology of a new upset mechanism induced by protons in deep sub-micron devices

Florent Miller, D. Alexandrescu, Cécile Weulersse, 2012, Microelectron. Reliab..

Experimental Assessment of Cache Memory Soft Error Rate Prediction Technique

Thomas Santini, Florent Miller, Regis Leveugle, 2012, IEEE Transactions on Nuclear Science.

Test Method for a software application.

Florent Miller, Nadine Buard, T. Carriere, 2007 .

Measurement and calculation of charge deposition in a silicon diode irradiated by 30 MeV protons

Florent Miller, Nadine Buard, Frédéric Wrobel, 2008 .

Comparison of single event transients generated at four pulsed-laser test facilities - NRL, IMS, EADS, JPL

Florent Miller, Jeffrey H. Warner, Gregory R. Allen, 2011 .