S. Uhlig

Piezoresistivity of polycrystalline silicon applying the AIC process-route

S. Uhlig, Stephan Rau, Günter Schultes, 2011 .

New developments in X-ray fluorescence analysis of metallic and mining samples

S. Uhlig, 1991 .

Advanced packaging materials for optical applications: bridging the gap between nm-size structures and large-area panel processing

Jesper Serbin, Peter Dannberg, S. Uhlig, 2006, SPIE OPTO.