U. H. Jeong

A study on the reliability of equipment system through case-study on the manufacture of machinery/electronic equipment using practical QRM (quality, reliability, maintenance) process and evaluation index

Y. G. Yoon, Y. G. Yoon, S. W. Yu, 2019, Microelectronics Reliability.

Life time comparison of LED package and the self-ballasted LED lamps by simple linear regression analysis

H. W. Lim, Y. G. Yoon, U. H. Jeong, 2015, Microelectron. Reliab..

Charging-discharging characteristics of a wound aluminum polymer capacitor

D. H. Lee, H. W. Lim, Y. G. Yoon, 2016, Microelectron. Reliab..

Wear-out failure modes and mechanism analysis of self-ballasted LED lamps via after-sale service data

J. P. Hyung, U. H. Jeong, Y. G. Yoon, 2016, 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).