S. Oussalah

Automated MOS transistor degradation measurements based on labVIEW

S. Oussalah, B. Djezzar, 2007, 2007 International Conference on Design & Technology of Integrated Systems in Nanoscale Era.

Program for the optimization of an OTA for front end electronics based on multi objective genetic algorithms

S. Oussalah, A. Dendouga, A. Lounis, 2014, 2014 29th International Conference on Microelectronics Proceedings - MIEL 2014.

Investigation of gate oxide thickness effect on the radiation-induced traps in MOSFET devices using OTCP method

S. Oussalah, B. Djezzar, A. Smatti, 2007, 2007 International Conference on Design & Technology of Integrated Systems in Nanoscale Era.

Field Acceleration Model for TDDB: Still a Valid Tool to Study the Reliability of Thick $\hbox{SiO}_{2}$-Based Dielectric Layers?

S. Oussalah, B. Djezzar, B. Djezzar, 2007, IEEE Transactions on Electron Devices.

A new oxide-trap based on charge-pumping (OTCP) extraction method for irradiated MOSFET devices: part II (low frequencies)

S. Oussalah, B. Djezzar, A. Smatti, 2004, IEEE Transactions on Nuclear Science.

A new oxide-trap based on charge-pumping (OTCP) extraction method for irradiated MOSFET devices: part I (high frequencies)

S. Oussalah, B. Djezzar, A. Smatti, 2004, IEEE Transactions on Nuclear Science.

Comparison between OTCP and C-V extraction methods for radiation-induced traps in MOSFET devices

S. Oussalah, B. Djezzar, H. Tahi, 2008, 2008 IEEE International Conference on Semiconductor Electronics.