Zhichun Wang

Simulation study of Electrical Capacitance Tomography

Wenjing Zhang, Zhichun Wang, 2011, 2011 Second International Conference on Mechanic Automation and Control Engineering.

Study on Capacitance Sensor Simulation of Ice Thickness Measurement Based on ANSYS

Wentao Li, Jianhang Wang, Zhichun Wang, 2014 .

Correlation between hot carrier stress, oxide breakdown and gate leakage current for monitoring plasma processing induced damage on gate oxide

J. Ackaert, E. De Backer, C. Salm, 2002, 7th International Symposium on Plasma- and Process-Induced Damage.

Correlation between hot carrier stress, oxide breakdown and gate leakage current for monitoring plasma processing induced damage on gate oxide

J. Ackaert, E. De Backer, C. Salm, 2002, Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614).