N. Nagappan

Use of relative code churn measures to predict system defect density

N. Nagappan, T. Ball, T. Ball, 2005, Proceedings. 27th International Conference on Software Engineering, 2005. ICSE 2005..

Static analysis tools as early indicators of pre-release defect density

N. Nagappan, T. Ball, T. Ball, 2005, Proceedings. 27th International Conference on Software Engineering, 2005. ICSE 2005..