V. Palfi

Analyzing numerical optimization problems of finite resolution sine wave fitting algorithms

A. Moschitta, P. Carbone, B. Renczes, 2015, 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings.

Efficient execution of ADC test with sine fitting with verification of excitation signal parameter settings

V. Palfi, I. Kollar, I. Kollár, 2012, 2012 IEEE International Instrumentation and Measurement Technology Conference Proceedings.