J. Fellner

Fully Automatical Test and Qualification System for a High Endurance Embedded EEPROM Module

J. Fellner, G. Schatzberger, A. Wiesner, 2008, 2008 IEEE International Integrated Reliability Workshop Final Report.

Werkzeuge für die HSC-Zerspanung: Tools for HSC machining

J. Prast, W. Koch, J. Fellner, 2001 .

Lifetime study for a poly fuse in a 0.35 /spl mu/m polycide CMOS process

J. Fellner, P. Boesmueller, H. Reiter, 2005, 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..