A. E. Zitzelsberger

Modeling bimodal electromigration failure distributions

A. H. Fischer, A. Abel, M. Lepper, 2001, Microelectron. Reliab..

The quantitative assessment of stress-induced voiding in process qualification

A. E. Zitzelsberger, A. H. Fischer, 2001, 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167).