Rosalinda M. Ring

Optical tools and techniques for failure analysis of modern integrated circuits

Paiboon Tangyunyong, Edward I. Cole, Charles F. Hawkins, 2003, The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003..

Resistive interconnection localization

Rosalinda M. Ring, C. Hawkins, P. Tangyunyong, 2002, Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614).

Controlled silicon thinning for design debug of C4 packaged ICs

Nicholas Antoniou, Victoria J. Bruce, Rosalinda M. Ring, 1999, 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296).

Soft defect localization (SDL) in integrated circuits using laser scanning microscopy

Paiboon Tangyunyong, Edward I. Cole, Charles F. Hawkins, 2003, The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003..