P. Petrik

Expanded beam spectro-ellipsometry for big area on-line monitoring

M. Fried, C. Major, G. Juhasz, 2015, Optical Metrology.

Design and process development of a photonic crystal polymer biosensor for point-of-care diagnostics

R. M. De La Rue, P. Petrik, F. Dortu, 2011, European Conference on Biomedical Optics.

Ellipsometric study of SiN/sub x//nc-Si/SiN/sub x/ multilayers

P. Petrik, P. Basa, P. Petrik, 2005, CAS 2005 Proceedings. 2005 International Semiconductor Conference, 2005..

Methods for optical modeling and cross-checking in ellipsometry and scatterometry

H. P. Urbach, M. Fried, G. Juhasz, 2015, Optical Metrology.

Annealing effect on optical barrier in ion-implanted tellurite glass waveguides

S. Berneschi, I. Cacciari, G. C. Righini, 2009, OPTO.

Modular PC-controlled polarimetric ellipsometer with variable angle of incidence and spectral options

P. Petrik, Miklos Fried, Tamas Mosoni, 1998, Other Conferences.

Characterisation of slab waveguides, fabricated in CaF2 and Er-doped tungsten-tellurite glass by MeV energy N+ ion implantation, using spectroscopic ellipsometry and m-line spectroscopy

S. Berneschi, G. C. Righini, M. Brenci, 2010, Photonics Europe.

MeV Energy $\hbox{N}^{+}$-Implanted Planar Optical Waveguides in Er-Doped Tungsten-Tellurite Glass Operating at 1.55 $\mu\hbox{m}$

M. Brenci, G. C. Righini, S. Pelli, 2012, IEEE Photonics Journal.

Ellipsometric study of polycrystalline silicon films prepared by low-pressure chemical vapor deposition

P. Petrik, Heiner Ryssel, Miklos Fried, 2000 .