J. S. Yuan

Impact of strain on hot electron reliability of dual-band power amplifier and integrated LNA-mixer RF performances

Wen-Kuan Yeh, J. S. Yuan, J. Ma, 2010, Microelectron. Reliab..

Voltage stress effect on class AB power amplifier and mixed-signal sample-hold circuit

J. S. Yuan, J. Ma, 2010, Microelectron. Reliab..