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Hot carrier reliability considerations in the integration of dual gate oxide transistor process on a sub-0.25 /spl mu/m CMOS technology for embedded applications

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Dynamic interface flight test and simulation limitations

D. Carico, J. Higman, K. E. MacCallum, 1985 .

Realistic Projections of Product Fails from NBTI and TDDB

M. Mendicino, S. Venkatesan, A. Haggag, 2006, 2006 IEEE International Reliability Physics Symposium Proceedings.