Y. Matsushita

A 10 b 20-Msample/s 28 mW CMOS ADC in ASIC process

A. Wada, K. Tani, Y. Matsushita, 1998, Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372).

The influence of SiN films on negative bias temperature instability and characteristics in MOSFET's

Y. Matsushita, K. Yodoshi, Atsuhiro Nishida, 1998, ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157).