Ki Hwan Seok

发表

Edge Cut Process for Reducing Ni Content at Channel Edge Region in Metal Induced Lateral Crystallization Poly-Si TFTs

Seung-Ki Joo, Jae Hyo Park, Yong Hee Lee, 2016 .

Integrating Epitaxial-Like Pb(Zr,Ti)O3 Thin-Film into Silicon for Next-Generation Ferroelectric Field-Effect Transistor

Ki Hwan Seok, S. Joo, Jae Hyo Park, 2016, Scientific Reports.

Sub-kT/q Subthreshold-Slope Using Negative Capacitance in Low-Temperature Polycrystalline-Silicon Thin-Film Transistor

Ki Hwan Seok, S. Joo, Jae Hyo Park, 2016, Scientific Reports.

Thermal Stress Effects on the Electrical Properties of p-Channel Polycrystalline-Silicon Thin-Film Transistors Fabricated via Metal-Induced Lateral Crystallization

Ki Hwan Seok, S. Joo, Jae Hyo Park, 2015, IEEE Transactions on Semiconductor Manufacturing.

Bottom-gate poly-Si thin-film transistors by nickel silicide seed-induced lateral crystallization with self-aligned lightly doped layer

Ki Hwan Seok, S. Joo, Ji Su Han, 2017 .

Multibit ferroelectric field-effect transistor with epitaxial-like Pb(Zr,Ti)O3

Ki Hwan Seok, S. Joo, Jae Hyo Park, 2016 .

Effect of nickel silicide gettering on metal-induced crystallized polycrystalline-silicon thin-film transistors

Ki Hwan Seok, S. Joo, Hyung Yoon Kim, 2017 .

Retraction: Integrating Epitaxial-Like Pb(Zr,Ti)O3 Thin-Film into Silicon for Next-Generation Ferroelectric Field-Effect Transistor

Ki Hwan Seok, S. Joo, Jae Hyo Park, 2016, Scientific Reports.

Tempered glass substrate effect on the growth of polycrystalline-silicon and its applications for reliable thin-film transistors

Ki Hwan Seok, S. Joo, Jae Hyo Park, 2015 .

Effect of Ultrathin Silicon Oxide Film for Enhanced Performance and Reliability of Metal-Induced Laterally Crystallized Thin-Film Transistors Using Silicon Nitride as a Gate Dielectric

Ki Hwan Seok, S. Joo, Hyung Yoon Kim, 2016 .

Direct/Indirect Junction Between Channel Inversion Layer and Doped Source/Drain Region on Metal-Induced Lateral Crystallization Polycrystalline Silicon Bottom Gate TFTs

Ki Hwan Seok, S. Joo, Hyung Yoon Kim, 2017, IEEE Transactions on Electron Devices.

Advanced Four-Mask Process Bottom-Gate Poly-Si TFT via Self-Aligned NiSi2 Seed-Induced Lateral Crystallization

Ki Hwan Seok, S. Joo, Hyung Yoon Kim, 2016, IEEE Electron Device Letters.

Retrograde-Mask Processed Polysilicon TFT for High Performance, Planar Structure, and Stable Operation

Ki Hwan Seok, S. Joo, Jae Hyo Park, 2015, IEEE Electron Device Letters.

A hybrid ferroelectric-flash memory cells

Ki Hwan Seok, D. Ahn, S. Joo, 2014 .