Andrew H. Olney

Design rules for a reliable surface micromachined IC sensor

J. Chang, S. Bart, T. Core, 1995, Proceedings of 1995 IEEE International Reliability Physics Symposium.

Using charged device model testing to eliminate real-world ESD failures

Andrew H. Olney, 1998 .

CDM ESD current characterization — Package variability effects and comparison to die-level CDM

Javier A. Salcedo, Thorsten Weyl, Alan W. Righter, 2009, 2009 31st EOS/ESD Symposium.

Eliminating the top causes of customer-attributable integrated circuit failures

Andrew H. Olney, 2013, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).