K. N. Vu

Radiation Effects On InP-Based Electrical & Optical Devices

K. N. Vu, J. Y. Yaung, J. Yaung, 1989, Other Conferences.

The Dependence of Latch-Up Sensitivity on Layout Features in CMOS Integrated Circuits

A. A. Witteles, J. S. Cable, K. N. Vu, 1986, IEEE Transactions on Nuclear Science.

Experimental and analytical investigation of single event, multiple bit upsets in poly-silicon load, 64 K*1 NMOS SRAMs

R. Koga, A. A. Witteles, W. A. Kolasinski, 1988 .

Parametric investigation of latch-up sensitivity in 1.25 μm CMOS technology

J. S. Cable, K. N. Vu, J. Cable, 1987, IEEE Transactions on Nuclear Science.