V. P. Markevich

Impedance and barrier capacitance of silicon diodes implanted with high-energy Xe ions

Andreas D. Wieck, N. A. Poklonski, N. I. Gorbachuk, 2010, Microelectron. Reliab..

Breakdown and degradation of ultrathin Hf-based (HfO2)x (SiO2)1-x gate oxide films

Steve Hall, B. Hamilton, Ivona Z. Mitrovic, 2009 .

Vacancy-related complexes in neutron-irradiated silicon

Anthony R. Peaker, I. D. Hawkins, V. P. Markevich, 2005 .

EPR Study of Hydrogen‐Related Radiation‐Induced Shallow Donors in Silicon

Teimuraz Mchedlidze, V. P. Markevich, V. Markevich, 1998 .