K.-E. Elssner

Absolute flatness testing by an extended rotation method: measurements

K.-E. Elssner, 1993, International Commission for Optics.

Interferometric Extended Refractive Index Inhomogeneity Measurement Of Optical Glass

K.-E. Elssner, R. Burow, R. Buthmann, 1990, Other Conferences.

Absolute Sphericity Measurement: a Comparative Study on the Use of Interferometry and a Shack-Hartmann Sensor

K.-E. Elssner, Johannes Schwider, Norbert Lindlein, 1998, CLEO/Europe Conference on Lasers and Electro-Optics.

Semiconductor wafer and technical flat planeness testing interferometer

K.-E. Elssner, Johannes Schwider, R. Burow, 1986 .