O. Maire-Richard

A statistical approach to cycle time management

S. Aparicio, J. Becerro, M. Fernandez, 2001, 2001 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (IEEE Cat. No.01CH37160).

Statistical bin analysis on wafer probe

O. Maire-Richard, S. Muriel, P. Garcia, 2001, 2001 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (IEEE Cat. No.01CH37160).