T. Ambler
发表
T. Riedel,
J. Kaminski,
M. G. Wahl,
1999,
1999 IEEE AUTOTESTCON Proceedings (Cat. No.99CH36323).
Yu-Ting Lin,
T. Ambler,
2005,
Proceedings of 2005 IEEE Conference on Control Applications, 2005. CCA 2005..
T. Ambler,
Hyun-Moo Kim,
2002,
Proceedings, IEEE AUTOTESTCON.
Jacob A. Abraham,
T. Ambler,
Byoung Ho Kim,
2007
.
Yu-Ting Lin,
T. Ambler,
Il-Soo Lee,
2005,
IEEE Autotestcon, 2005..
T. Ambler,
B. Bennetts,
1999
.
T. Ambler,
C. Schuhmacher,
1999,
1999 IEEE AUTOTESTCON Proceedings (Cat. No.99CH36323).
T. Ambler,
B. Saunders,
C. Mewes,
2015
.
Dongho Kim,
T. Ambler,
2000,
Proceedings of the 2000 Third IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.00TH8474).
Seokjin Lee,
Dongho Kim,
T. Ambler,
2001,
Proceedings of the 44th IEEE 2001 Midwest Symposium on Circuits and Systems. MWSCAS 2001 (Cat. No.01CH37257).
T. Ambler,
2001,
IEEE Design & Test of Computers.
M. G. Wahl,
T. Ambler,
Christoph Maass,
2000
.
T. Ambler,
M.G. Wahl,
C. Maass,
2000,
Proceedings of the IEEE 2000 National Aerospace and Electronics Conference. NAECON 2000. Engineering Tomorrow (Cat. No.00CH37093).
T. Riedel,
M. G. Wahl,
T. Ambler,
1998,
1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179).