Sofie Beyne

On the design of an automated system for the characterization of the electromigration performance of advanced interconnects by means of low-frequency noise measurements

Gino Giusi, Carmine Ciofi, Graziella Scandurra, 2023, Metrology and Measurement Systems.

The first observation of p-type electromigration failure in full ruthenium interconnects

Ingrid De Wolf, Kris Croes, Zsolt Tokei, 2018, 2018 IEEE International Reliability Physics Symposium (IRPS).

Low-Frequency Noise Measurements to Characterize Cu-Electromigration Down to 44nm Metal Pitch

Ingrid De Wolf, Zsolt Tokei, Kristof Croes, 2019, 2019 IEEE International Reliability Physics Symposium (IRPS).