E. Novarini

发表

HBM and TLP ESD robustness in smart-power protection structures

Gaudenzio Meneghesso, Enrico Zanoni, S. Santirosia, 1999 .

ESD robustness of smart-power protection structures evaluated by means of HBM and TLP tests

Gaudenzio Meneghesso, Enrico Zanoni, Claudio Contiero, 2000, 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059).

Integrated Schottky diodes in BCD5 technology for high frequency soft switched power converters

Enrico Dallago, A. Gola, G. Sassone, 2000, 2000 IEEE 31st Annual Power Electronics Specialists Conference. Conference Proceedings (Cat. No.00CH37018).