Dmitri O. Klenov

发表

Nanoscale Chemical Compositional Analysis with an Innovative S/TEM-EDX System

Peter Schlossmacher, Dmitri O. Klenov, Bert Freitag, 2010 .

Enhanced gas sensing by individual SnO2 nanowires and nanobelts functionalized with Pd catalyst particles.

Dmitri O. Klenov, S. Stemmer, A. Kolmakov, 2005, Nano letters.

Thermal conductivity reduction and thermoelectric figure of merit increase by embedding nanoparticles in crystalline semiconductors.

Dmitri O. Klenov, A. Gossard, A. Majumdar, 2006, Physical review letters.

Enhanced Detection Sensitivity with a New Windowless XEDS System for AEM Based on Silicon Drift Detector Technology

Bert Freitag, Dmitri O. Klenov, P Schlossmacher, 2010, Microscopy Today.

Atomic-resolution chemical mapping using energy-dispersive x-ray spectroscopy

Leslie J. Allen, Bert Freitag, Adrian J. D’Alfonso, 2010 .

Reducing thermal conductivity of crystalline solids at high temperature using embedded nanostructures.

Dmitri O. Klenov, A. Gossard, A. Majumdar, 2008, Nano letters.

Electrostatic carrier doping of GdTiO3/SrTiO3 interfaces

Siddharth Rajan, Susanne Stemmer, Pouya Moetakef, 2011 .

Thermoelectric power factor in semiconductors with buried epitaxial semimetallic nanoparticles

Ali Shakouri, John E. Bowers, Arthur C. Gossard, 2005 .

Reactions of Y2O3 films with (001) Si substrates and with polycrystalline Si capping layers

Dmitri O. Klenov, S. Stemmer, G. Parsons, 2002 .

Strain relaxation in transistor channels with embedded epitaxial silicon germanium source/drain

Dmitri O. Klenov, A. See, F. Benistant, 2008 .

Chemical mapping at atomic resolution using energy-dispersive x-ray spectroscopy

Dmitri O. Klenov, A. J. D’Alfonso, L. Allen, 2012 .

Structure of the InAlAs/InP interface by atomically resolved energy dispersive spectroscopy

Dmitri O. Klenov, J. Zide, 2011 .

Contribution of thermally scattered electrons to atomic resolution elemental maps

Dmitri O. Klenov, H. Fraser, A. J. D’Alfonso, 2012 .

Influence of orientation on the contrast of high-angle annular dark-field images of silicon

Dmitri O. Klenov, L. Allen, S. Stemmer, 2007 .

Extended defects in epitaxial Sc2O3 films grown on (111) Si

Dmitri O. Klenov, S. Stemmer, L. Edge, 2005 .

The Interface between Single Crystalline (001) LaAlO3 and (001) Silicon

Dmitri O. Klenov, S. Stemmer, D. Schlom, 2005 .

Interface atomic structure of epitaxial ErAs layers on (001) In0.53Ga0.47As and GaAs

Dmitri O. Klenov, A. Gossard, S. Stemmer, 2005 .

Atomic number contrast in high angle annular dark field imaging of crystals

Dmitri O. Klenov, L. Allen, S. Stemmer, 2008 .

High temperature stability of Hf-based gate dielectric stacks with rare-earth oxide layers for threshold voltage control

Dmitri O. Klenov, A. Kingon, J. Maria, 2008 .

Self-organized anisotropic (Zr1−xSix)Ny nanocomposites grown by reactive sputter deposition

Dmitri O. Klenov, I. Petrov, M. Odén, 2015 .

Nanolabyrinthine ZrAlN thin films by self-organization of interwoven single-crystal cubic and hexagonal phases

Dmitri O. Klenov, I. Petrov, M. Odén, 2013 .

Atomic Structure of (111) SrTiO3/Pt Interfaces

Dmitri O. Klenov, S. Stemmer, T. Mates, 2006 .

Impact of stress on oxygen vacancy ordering in epitaxial (La0.5Sr0.5)CoO3−∂ thin films

Dmitri O. Klenov, S. Stemmer, W. Donner, 2003 .

SrTiO_3 films on platinized (0001) Al_2O_3: Characterization of texture and nonstoichiometry accommodation

Dmitri O. Klenov, S. Stemmer, T. Taylor, 2004, Journal of Materials Research.

Electrostatic carrier doping of GdTiO3/SrTiO3 interfaces

Dmitri O. Klenov, A. Janotti, C. Walle, 2011, 1111.4684.

Vacancy ordering in the structure of γ-Al2O3

Dmitri O. Klenov, S. Tsybulya, G. Kryukova, 2000 .

Influence of strain on the dielectric relaxation of pyrochlore bismuth zinc niobate thin films

Dmitri O. Klenov, S. Stemmer, Jiwei Lu, 2004 .

Electrical and material characterizations of high-permittivity HfxTi1−xO2 gate insulators

Dmitri O. Klenov, S. Campbell, S. Stemmer, 2005 .

Characterization of Bi1.5ZnNb1.5O7-x Pyrochlore Thin Films by High-angle Annular Dark-field Imaging in STEM

Dmitri O. Klenov, S. Stemmer, Jiwei Lu, 2005, Microscopy and Microanalysis.

Microstructure of Epitaxial SrTiO_3/Pt/Ti/ Sapphire Heterostructures

Dmitri O. Klenov, S. Stemmer, Y. Ok, 2005 .

Microstructure and Dielectric Properties of Textured SrTiO3 Thin Films

Dmitri O. Klenov, S. Stemmer, Jiwei Lu, 2005 .

Contributions to the contrast in experimental high-angle annular dark-field images.

Dmitri O. Klenov, S. Stemmer, 2006, Ultramicroscopy.

Application to Semiconductors

Dmitri O. Klenov, S. Stemmer, J. Lebeau, 2011 .

Composition control of radio-frequency magnetron sputter-deposited La_0.5Sr_0.5CoO_3−∂ thin films

Dmitri O. Klenov, S. Stemmer, A. Jacobson, 2003 .

Detection and mobility of hafnium in SiO2

Dmitri O. Klenov, S. Stemmer, T. Mates, 2006 .

Challenges to Quantitative Multivariate Statistical Analysis of Atomic-Resolution X-Ray Spectral

Dmitri O. Klenov, P. Kotula, H. S. von Harrach, 2012, Microscopy and Microanalysis.

Comparison of the Detection Limits of EDS and EELS in S/TEM

Dmitri O. Klenov, H. Fraser, P. Collins, 2010 .

Limitations in Through-Focus Depth Sectioning in Non-Aberration Corrected High-Angle Annular Dark-Field Imaging

Dmitri O. Klenov, S. Stemmer, 2006 .

Single crystalline Pr2−xYxO3 (x=0–2) dielectrics on Si with tailored electronic and crystallographic structure

Dmitri O. Klenov, T. Schroeder, M. Schubert, 2010 .

Surface sensitization of metal oxide quasi-1D sensors: in situ comparative study of pristine and Pd doped individual SnO/sub 2/ nanostructure

Dmitri O. Klenov, S. Stemmer, A. Kolmakov, 2005, IEEE Sensors, 2005..

Microstructure and dielectric properties of textured SrTiO 3 thin films

Dmitri O. Klenov, Jiwei Lu, S. P. Keane, 2004 .