R. Mihailovich
发表
L. Tran,
P. Richardson,
E. Sovero,
1998,
1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179).
R. Mihailovich,
J. Waldrop,
J. DeNatale,
2002,
2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320).