P. Heino

Evaluation Of Resonating Channel Transistor In SOI Wafer

S. Myllymaki, Eero Ristolainen, P. Heino, 2003, Int. J. Comput. Eng. Sci..

Impact of component placement in solder joint reliability

Eero Ristolainen, P. Heino, T. Alander, 2002, Microelectron. Reliab..

Strength of Ta-Si interfaces by molecular dynamics

Eero Ristolainen, P. Heino, P. Heino, 2003, Microelectron. Reliab..

Molecular dynamics study of thermally induced shear strain in nanoscale copper

P. Heino, E. Ristolainen, P. Heino, 1999 .

Accelerated testing for failures of tantalum capacitors

Laura Frisk, Johanna Virkki, P. Heino, 2010, Microelectron. Reliab..

Knowledge Based Risk Management System for Process Industry

P. Heino, Jouko Suokas, R. Wennersten, 1989, SCAI.

Design of Safe and Reliable Process Systems by Knowledge Based Safety Analysis

P. Heino, Jouko Suokas, I. Karvonen, 1989, SCAI.

Low temperature acclimation and treatment with exogenous abscisic acid induce common polypeptides in Arabidopsis thaliana (L.) Heynh

P. Heino, P. Heino, E. T. Palva, 1989, Theoretical and Applied Genetics.