A. A. Abou-Auf

Worst-case test vectors for functional failure induced by total dose in CMOS microcircuits with transmission gates

A. A. Abou-Auf, D. F. Barbe, M. M. Rushdi, 1997 .

A methodology for the identification of worst-case test vectors for logical faults induced in CMOS circuits by total dose

H. A. Eisen, A. A. Abou-Auf, D. F. Barbe, 1994 .

PC program to calculate the one-sided lower tolerance limit for total-ionizing-dose radiation data. Final report, Sep 90-Jan 91

A. A. Abou-Auf, M. E. Bumbaugh, 1991 .

Gate-level modeling of leakage current failure induced by total dose for the generation of worst-case test vectors

A. A. Abou-Auf, 1996 .