David C. Joy

发表

Initial results with a point projection microscope

Bernhard G. Frost, David C. Joy, 2001, SPIE Advanced Lithography.

System considerations for maskless lithography

L. G. Clonts, David C. Joy, Thomas P. Karnowski, 2004, SPIE Advanced Lithography.

Soft electron beam etching for precision TEM sample preparation

David C. Joy, Jason D. Fowlkes, Philip D. Rack, 2003, SPIE Advanced Lithography.

Computer-Aided Imaging

David C. Joy, Patrick Echlin, Eric Lifshin, 1990 .

Applications of image diagnostics to metrology quality assurance and process control

Alexander Starikov, James E. Potzick, Mark P. Davidson, 2003, SPIE Advanced Lithography.

Image Contrast and Quality

David C. Joy, Patrick Echlin, Eric Lifshin, 1990 .

Separation and characterization of single-chain polymer particles

David C. Joy, Reinhard Festag, Bernhard Wunderlich, 1996, Optics & Photonics.

Simulation of repairing thin-film phase defect in masks for EUV lithography

Scott Daniel Hector, Bing Lu, David C. Joy, 2003, SPIE Advanced Lithography.

Special Topics in Scanning Electron Microscopy

David C. Joy, Patrick Echlin, Eric Lifshin, 2003 .

Low vacuum microscopy for mask metrology

David C. Joy, 2004, SPIE Advanced Lithography.

Low-voltage-point source microscope for interferometry

Bernhard G. Frost, David C. Joy, Alexander Thesen, 2002, SPIE Advanced Lithography.

Computer modeling of charging-induced electron beam deflection in electron beam lithography

David C. Joy, Yeong-Uk Ko, Justin J. Hwu, 2000, Advanced Lithography.

Monte Carlo model of charging in resists in e-beam lithography

David C. Joy, Yeong-Uk Ko, 2001, SPIE Advanced Lithography.

Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences

Michael T. Postek, David C. Joy, Dale E. Newbury, 2011 .

DTSA-II EDS Software

David C. Joy, John Henry J. Scott, Joseph I. Goldstein, 2018 .

Evaluating SEM performance from the contrast transfer function

David C. Joy, Joseph R. Michael, Brendan J. Griffin, 2010, Advanced Lithography.

The early history and future of the SEM

David C. Joy, Oliver C. Wells, D. Joy, 2006 .

Monte Carlo model of charging in resists in e-beam lithography

David C. Joy, Yeong-Uk Ko, Justin J. Hwu, 2000, Advanced Lithography.

In-line holography using a point source

Bernhard G. Frost, David C. Joy, 1999, Advanced Lithography.

Feasibility Study for High Energy SEM‐Based Reference Measurement System for Litho Metrology

David C. Joy, Michael Bishop, 2005 .

ImageJ and Fiji

David C. Joy, John Henry J. Scott, Joseph I. Goldstein, 2018 .

Analytical electron microscopy 1987 : proceedings of a workshop held at Kona, Hawaii, 13-17 July 1987

David C. Joy, 1987 .

Device metrology with high-performance scanning ion beams

David C. Joy, Bill Ward, Lewis Stern, 2007, SPIE Advanced Lithography.

Basic SEM Imaging

David C. Joy, Patrick Echlin, Eric Lifshin, 1990 .

Modeling for metrology with a helium beam

David C. Joy, Brendan J. Griffin, Ranjan Ramachandra, 2008, SPIE Advanced Lithography.

Secondary electron spectroscopy for microanalysis and defect review

David C. Joy, Neeraj Khanna, D. N. Braski, 1999, Advanced Lithography.

1999 ITRS metrology roadmap and its implications for lithography

David C. Joy, Alain C. Diebold, 2000, Advanced Lithography.

Simulation of imaging in projection microscope using multibeam probe

David C. Joy, Yeong-Uk Ko, 2002, SPIE Advanced Lithography.

Magnification calibration standards for sub-100nm metrology

David C. Joy, Sachin Deo, 2007, SPIE Advanced Lithography.

Scanning electron microscopy: Present capability, future improvements and potential replacements

Bernhard G. Frost, David C. Joy, 2001 .

Length calibration standards for nano-manufacturing

David C. Joy, Brendan J. Griffin, Sachin Deo, 2007, SPIE NanoScience + Engineering.

Effects of low-voltage electron beam lithography

David C. Joy, Mehdi Bolorizadeh, D. Joy, 2006, SPIE Advanced Lithography.

Secondary-electron image profiles using bias voltage technique in deep contact hole

Martin E. Mastovich, David C. Joy, Neal T. Sullivan, 2001, SPIE Advanced Lithography.

Ultralow-energy imaging for metrology

David C. Joy, 1998, Advanced Lithography.

Future of e-beam metrology: obstacles and opportunities

David C. Joy, 2002, SPIE Advanced Lithography.

Metrics of resolution and performance for CD-SEMs

David C. Joy, Yeong-Uk Ko, Justin J. Hwu, 2000, Advanced Lithography.

Limitations of Sem Characterization of Semiconductors

David C. Joy, 1997 .

Computer-Aided Imaging and Interpretation

David C. Joy, Patrick Echlin, Joseph I. Goldstein, 1986 .

Some issues in SEM-based metrology

David C. Joy, 1998, Advanced Lithography.

Microcomputer control of a stem

David C. Joy, 1982 .

Electron channeling patterns in the scanning electron microscope

David C. Joy, David L. Davidson, Dale E. Newbury, 1982 .

Limits of SEM Resolution

David C. Joy, 1996 .

A new examination of secondary electron yield data

David C. Joy, D. Joy, Yinghong Lin, 2005 .

Effects of Engineered Cerium Oxide Nanoparticles on Bacterial Growth and Viability

Mitchel J. Doktycz, Wei Wang, David C. Joy, 2010, Applied and Environmental Microbiology.

Calculation of secondary electron production using a diffusion matrix

David C. Joy, Z. Czyżewski, 1991 .

Calculations of Mott scattering cross section

David C. Joy, A. D. Romig, Alton D. Romig, 1990 .

Fundamentals of Scanning Electron Microscopy (SEM)

David C. Joy, Weilie Zhou, D. Joy, 2006 .

Scanning Electron Microscopy and X-Ray Microanalysis

David C. Joy, John Henry J. Scott, Joseph I. Goldstein, 2017 .

EXPERIMENTAL MEASUREMENTS OF ELECTRON STOPPING POWER AT LOW ENERGIES

Raynald Gauvin, David C. Joy, Pierre Hovington, 1996 .

Limiting factors in sub- 10 nm scanning-electron-beam lithography

Bryan M. Cord, David C. Joy, Karl K. Berggren, 2009 .

Calibration of atomic force microscope tips using biomolecules

David C. Joy, Thomas Thundat, Robert J. Warmack, 1992 .

Surface characterization and functionalization of carbon nanofibers

Scott T. Retterer, David C. Joy, Michael L. Simpson, 2008 .

X-Ray Microanalysis in the AEM

David B. Williams, David C. Joy, A. D. Romig, 1990 .

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy

David B. Williams, David B. Williams, David C. Joy, 1990, Springer US.

An empirical stopping power relationship for low‐energy electrons

David C. Joy, D. Joy, S. Luo, 1989 .

A new high‐speed simulation method for electron‐beam critical dimension metrology profile modeling

David C. Joy, Xinlei Wang, 1991 .

The theory and practice of high resolution scanning electron microscopy

David C. Joy, D. Joy, 1991 .

Electron-Beam-Specimen Interactions

David C. Joy, Patrick Echlin, Eric Lifshin, 1975 .

Secondary electron imaging in the variable pressure scanning electron microscope

David C. Joy, D. Joy, J. Hwu, 1998 .

Monte Carlo Modeling of Ion Beam Induced Secondary Electrons

David C. Joy, Ranjan Ramachandra, D. Joy, 2014 .

Electron-beam focusing characteristics of double-gated carbon nanofiber based field emission sources

David C. Joy, Michael L. Simpson, Douglas H. Lowndes, 2007 .

Dynamic Charging in the Low Voltage SEM

David C. Joy, D. Joy, Carolyn S. Joy, 1995, Microscopy and Microanalysis.

Noise and Its Effects on the Low-Voltage SEM

David C. Joy, D. Joy, 2008 .

Principles of Analytical Electron Microscopy

David C. Joy, A. D. Romig, Joseph I. Goldstein, 1986, Springer US.

An introduction to Monte Carlo simulations

David C. Joy, D. Joy, 1991 .

Scanning electron microscopy for materials characterization

David C. Joy, D. Joy, 1997 .

Introduction to analytical electron microscopy

David C. Joy, Joseph I. Goldstein, D. Joy, 1979 .

Electron holography techniques for study of ferroelectric domain walls

David C. Joy, D. Joy, L. Allard, 1993 .

X-Ray Microanalysis Case Studies

David C. Joy, John Henry J. Scott, Joseph I. Goldstein, 2018 .

Monte Carlo Modeling for Electron Microscopy and Microanalysis

David C. Joy, D. Joy, 1995 .

A model for calculating secondary and backscattered electron yields

David C. Joy, D. Joy, 1987 .

Maskless Lithography and in situ Visualization of Conductivity of Graphene using Helium Ion Microscopy

David C. Joy, Adam J. Rondinone, D. Joy, 2015, Scientific Reports.

Submicrometer Microelectronics Dimensional Metrology: Scanning Electron Microscopy

Michael T. Postek, David C. Joy, D. Joy, 1987, Journal of Research of the National Bureau of Standards.

Condensed phase growth of single-wall carbon nanotubes from laser annealed nanoparticulates

David C. Joy, Michael A. Guillorn, Henrik Schittenhelm, 2001 .

Microelectronics Dimensional Metrology in the Scanning Electron Microscope, Part II

Michael T. Postek, David C. Joy, 1986 .

Introduction to electron holography

David C. Joy, Lawrence F. Allard, D. Joy, 1999 .

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

David C. Joy, Patrick Echlin, Joseph I. Goldstein, 1986, Springer US.

CASINO: A new monte Carlo code in C language for electron beam interactions—part III: Stopping power at low energies

Dominique Drouin, Raynald Gauvin, David C. Joy, 1997 .