David F. Ellis

Very fast transient simulation and measurement methodology for ESD technology development

Javier A. Salcedo, Jean-Jacques Hajjar, Yuanzhong Zhou, 2009, 2009 IEEE International Reliability Physics Symposium.

Transient safe operating area (TSOA) definition for ESD applications

Javier A. Salcedo, Jean-Jacques Hajjar, Yuanzhong Zhou, 2009, 2009 31st EOS/ESD Symposium.

Prediction of Gate Dielectric Breakdown in the CDM timescale utilizing very fast transmission line pulsing

Jean-Jacques Hajjar, Juin J. Liou, Slavica Malobabic, 2009, 2009 IEEE International Reliability Physics Symposium.