Liu Biwei

发表

Novel N-hit single event transient mitigation technique via open guard transistor in 65 nm bulk CMOS process

Chen Jianjun, Huang Pengcheng, Chen Shuming, 2013 .

Simulation Study of Node-State Transition Effect on the Single-Event Transient

Liu Biwei, Du Yankang, Li Zhao, 2015, IEEE Transactions on Device and Materials Reliability.

Coupled SET pulses modeling based on LUT in ultra deep submicron technology

Chen Shuming, Liu Biwei, Liang Bin, 2008, TENCON 2008 - 2008 IEEE Region 10 Conference.

Key Factors of Single Event Latch-up in 180nm CMOS Technologies

Liu Biwei, 2011 .

Coupled SET Pulse Injection in a Circuit Simulator in Ultra-Deep Submicron Technology

Liu Zheng, Chen Shuming, Liu Biwei, 2008 .

Impact of pulse quenching effect on soft error vulnerabilities in combinational circuits based on standard cells

Chen Shuming, Liu Biwei, Du Yankang, 2013 .

Analyze of current components in NMOS single event transient

Liu Zheng, Chen Shuming, Liu Biwei, 2009, 2009 European Conference on Radiation and Its Effects on Components and Systems.

The Effect of Re-Convergence on SER Estimation in Combinational Circuits

Liu Zheng, Chen Shuming, Liu Biwei, 2009, IEEE Transactions on Nuclear Science.

Hot carrier effects of SOI NMOS

Liu Zheng, Liang Bin, Chen Shuming, 2010 .

SEU hardened SRAM design based on DICE cell

Liu Biwei, 2012 .

A mixed-level framework to estimate SER induced by SEMT in advanced technologies

Liu Biwei, Du Yankang, Wang Liping, 2015 .

A Self-Designed Heterogeneous Accelerator for Exascale High Performance Computing

Yang Qianming, Liu Biwei, Chen Xiaowen, 2021 .

The effect of P+ deep well doping on SET pulse propagation

Chen Shuming, Liu Biwei, Chen Jianjun, 2012 .

Impact of Circuit Placement on Single Event Transients in 65 nm Bulk CMOS Technology

Chen Shuming, Liu Biwei, Du Yankang, 2012, IEEE Transactions on Nuclear Science.

Temperature Dependence of Digital SET Pulse Width in Bulk and SOI Technologies

Chen Shuming, Liu Biwei, Liang Bin, 2008 .