Jean-Luc Ogier

Investigation of the effects of constant voltage stress on thin SiO2 layers using dynamic measurement protocols

Romain Laffont, Pascal Masson, Jérémy Postel-Pellerin, 2012, Microelectron. Reliab..

Access resistor modelling for EEPROM's retention test vehicle

J. Postel-Pellerin, P. Canet, Jean-Luc Ogier, 2013, Microelectron. Reliab..

An experimental method allowing quantifying and localizing failed cells of an EEPROM CAST after a retention test

G. Micolau, R. Laffont, A. Firiti, 2008 .