Hongyuan Su

A Novel Electrical Evaluation Approach for Inhomogeneous Current Distribution in Parallel-Connected IGBT Modules

Lixin Wang, Jiajun Luo, Lulu Wang, 2018, 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Investigations on the Degradation of 1.2-kV 4H-SiC MOSFETs Under Repetitive Short-Circuit Tests

Yan Wang, Gang Dai, Ruifeng Yue, 2016, IEEE Transactions on Electron Devices.

A Deep Insight Into the Degradation of 1.2-kV 4H-SiC mosfets Under Repetitive Unclamped Inductive Switching Stresses

Yan Wang, Zhiping Yu, Gang Dai, 2018, IEEE Transactions on Power Electronics.